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Nearfield Instruments
Quadra - High Throughput Scanning Probe Microscopy

Nearfield Instruments introduces breakthrough technology with their High-Throughput Scanning Probe Microscopy metrology equipment, utilizing four patented high-speed miniaturized Atomic Force Microscopes in parallel in a single metrology tool. We developed this High Tech 3D visualisation.

3D / Animation / High-tech / Innovation / Nearfield Instruments
Nearfield-Instruments-Quadra-Overview-setup-3D-visualisation.jpg
Nearfield-Instruments-Quadra-3D-slice.jpg
Nearfield-Instruments-Quadra-Scanning-Probe-Microscopy-Up.jpg
Nearfield-Instruments-Quadra-Scanning-Probe-Microscopy-Wafer-transport.jpg
Nearfield-Instruments-Quadra-Probe-Pickup-3D-inside-view.jpg
Nearfield-Instruments-Quadra-How-it-looks-inside-3D-visualisation.jpg
Nearfield-Instruments-Quadra-Wafer-Marker-3D-closeup.jpg
Nearfield-Instruments-Quadra-Probe-Pickup-Close-up-3D-hightech.jpg

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